2026
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Evaluating LLM-Based Test Generation for a Large Industrial C++ Database System. A Case Study on SAP HANA
ESEM 2026 · SEIP track · Best in Practice Paper Award
@InProceedings{bekmyradov_et_al:LIPIcs.ESEM.2026.95, author = {Bekmyradov, Vekil and Bach, Thomas and Berndt, Alexander and Puetz, Noah C. and Bogacz, Bartosz and Bartz-Beielstein, Thomas}, title = {{Evaluating LLM-Based Test Generation for a Large Industrial C++ Database System. A Case Study on SAP HANA}}, booktitle = {20th International Symposium on Empirical Software Engineering and Measurement (ESEM 2026)}, pages = {95:1--95:20}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-450-5}, ISSN = {1868-8969}, year = {2026}, volume = {394}, editor = {Feldt, Robert and Paasivaara, Maria and Mendez, Daniel and Wagner, Stefan and Bar\'{o}n, Marvin Mu\~{n}oz}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.ESEM.2026.95}, URN = {urn:nbn:de:0030-drops-280632}, doi = {10.4230/LIPIcs.ESEM.2026.95}, annote = {Keywords: LLM, Test Generation, Software Testing, Mutation Testing, DBMS} } -
Can We Classify Flaky Tests Using Only Test Code? An LLM-Based Empirical Study
@inproceedings{DBLP:conf/saner/BerndtBGKBB26, author = {Alexander Berndt and Vekil Bekmyradov and Rainer Gemulla and Marcus Kessel and Thomas Bach and Sebastian Baltes}, title = {Can We Classify Flaky Tests Using Only Test Code? An LLM-Based Empirical Study}, booktitle = {{IEEE} International Conference on Software Analysis, Evolution and Reengineering, {SANER} 2026, Limassol, Cyprus, March 17-20, 2026}, pages = {70--79}, publisher = {{IEEE}}, year = {2026}, doi = {10.1109/SANER67736.2026.00016} }